- All sections
- G - Physics
- G01R - Measuring electric variables; measuring magnetic variables
- G01R 1/073 - Multiple probes
Patent holdings for IPC class G01R 1/073
Total number of patents in this class: 2185
10-year publication summary
|
167
|
119
|
161
|
198
|
209
|
242
|
239
|
210
|
236
|
74
|
| 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Kabushiki Kaisha Nihon Micronics | 377 |
111 |
| Technoprobe S.p.A. | 128 |
106 |
| NHK Spring Co., Ltd. | 1657 |
85 |
| Tokyo Electron Limited | 11599 |
84 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 36809 |
74 |
| FormFactor, Inc. | 296 |
58 |
| Nidec-Read Corporation | 169 |
52 |
| Advantest Corporation | 1939 |
45 |
| Japan Electronic Materials Corp. | 57 |
44 |
| MPI Corporation | 111 |
44 |
| Intel Corporation | 45621 |
43 |
| Chunghwa Precision Test Tech Co., Ltd. | 47 |
37 |
| Microfabrica Inc. | 138 |
36 |
| Yokowo Co., Ltd. | 464 |
35 |
| Samsung Electronics Co., Ltd. | 131630 |
34 |
| Point Engineering Co., Ltd. | 239 |
34 |
| International Business Machines Corporation | 60644 |
29 |
| Leeno Industrial Inc. | 65 |
28 |
| Johnstech International Corporation | 140 |
25 |
| Murata Manufacturing Co., Ltd. | 22355 |
24 |
| Other owners | 1157 |